By Gracieli Posser,Sachin S. Sapatnekar,Ricardo Reis

This e-book describes new and powerful methodologies for modeling, examining and mitigating cell-internal sign electromigration in nanoCMOS, with major circuit lifetime advancements and no influence on functionality, quarter and gear. The authors are the 1st to research and suggest an answer for the electromigration results inside of common sense cells of a circuit. They convey during this booklet that an interconnect within a mobilephone can fail lowering significantly the circuit lifetime and so they display a strategy to optimize the life of circuits, via putting the output, Vdd and Vss pin of the cells within the much less serious areas, the place the electromigration results are lowered. Readers might be enabled to use this system just for the serious cells within the circuit, heading off influence within the circuit hold up, zone and function, hence expanding the life of the circuit with out loss in different characteristics. 

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